22

High-field electron trapping and detrapping characteristics in thin SiOxNy films

Year:
1991
Language:
english
File:
PDF, 124 KB
english, 1991
23

Study on the current transport mechanisms in thin SiOxNy films

Year:
1991
Language:
english
File:
PDF, 249 KB
english, 1991
24

Density and ionic structure of NdF3-LiF melts

Year:
2010
Language:
english
File:
PDF, 287 KB
english, 2010
32

A measurement method for contact angle based on Hough Transformation

Year:
2013
Language:
english
File:
PDF, 730 KB
english, 2013